신소재공학 레포트 현미경

신소재공학 레포트 현미경

신소재공학 레포트 현미경.hwp

본문 -The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is typically silicon or silicon nitride with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hookes law. Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces , Casimir forces, solvation forces, etc. Along with force, additional quantities may simultaneously be measured through the use of specialized types of probe . Typically, the deflection is measured using a laser spot reflected from the top surface of the cantilever into an array of photodiodes. Other methods that are used include optical interferometry, capacitive 하고 싶은 말 좀 더 업그레이드하여 자료를 보완하여, 과제물을 꼼꼼하게 정성을 들어 작성했습니다. 위 자료 요약정리 잘되어 있으니 잘 참고하시어 학업에 나날이 발전이 있기를 기원합니다 ^^ 구입자 분의 앞날에 항상 무궁한 발전과 행복과 행운이 깃들기를 홧팅 키워드 공학, 신소재공학, 레포트, 현미경